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REACH Statement

REACH Statement

Company statement regarding REACH SVHC compliance
  • File Type: (PDF)
  • Updated: 11/1/2023

Technical Notes

TN-00-08: Thermal Applications

This tech note describes considerations in thermal applications for Micron memory devices, including thermal impedance, thermal resistance, junction temperature, operating temperature, memory reliability, reliability modeling, device reliability, and high-temperature electronics.
  • File Type: PDF
  • Updated: 2022-08-09

TN-FD-10: P400e SSD SMART Implementation for FW0142

This technical note describes the SMART command (B0h) feature set for the P400e SSD.
  • File Type: PDF
  • Updated: 2012-12-12

TN-FD-06: P400e SATA SSD SMART Self-Test Reference

This technical note describes the self-test modes, commands, values, and result checks for the self-monitoring, analysis, and reporting technology (SMART) used for the P400e SATA SSDs.
  • File Type: PDF
  • Updated: 2011-12-19

Customer Service Notes

CSN-16: Micron Component and Module Packaging

Explanation of Micron packaging labels and procedures.
  • File Type: PDF
  • Updated: 2021-12-06

CSN-18: Bare Die SiPs and MCMs

Describes design considerations for bare die SiPs and MCMs.
  • File Type: PDF
  • Updated: 2009-04-06
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